Predicting Aging Caused Delay Degradation with Alternative IDDT Testing in a VLIW Processor
نویسندگان
چکیده
In this paper, delay and transient power-supply current (IDDT) testing has been applied for a 90nm VLIW DSP IP core, to demonstrate the IDDT testing an effective alternative of delay testing to detect aging degradation. The test environment for validation, implementing an accelerated test (AT) has been investigated, delay and IDDT measurement data resulting from AT is presented and analysed. It is found that both delay and IDDT testing results for the processor characterize the power law degradation with the aging trend, which is in coherence with behaviour of the NBTI aging mechanism. Analysis shows their coefficient is of strong correlation. Keywords—delay testing, IDDT testing, NBTI, functional testing, reliability testing, DSP processor, aging, alternative testing
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